Search results for "Scanning Hall probe microscope"
showing 9 items of 9 documents
Object size effect on the contact potential difference measured by scanning Kelvin probe method
2010
International audience; Contact potential difference (CPD) was measured by macroscopic Kelvin probe instrument and scanning Kelvin probe microscope on Al, Ni and Pt on ITO substrates at ambient conditions. CPD values measured by scanning Kelvin probe microscope and macroscopic Kelvin probe are close within the error of about 10-30% for large studied objects, whereas scanning Kelvin probe microscope signal decreases, when the object size becomes smaller than 1.4 m. CPD and electric field signals measured using many-pass technique allowed us to estimate the influence of electrostatic field disturbance, especially, in the case of small objects.
Numerical simulations of photon scanning tunneling microscopy: role of a probe tip geometry in image formation
2005
Abstract Numerical simulations of two-dimensional probe–object system emulating a photon scanning tunnelling microscope are presented. R -matrix propagation algorithm incorporated into the differential method was used to achieve an extended capability to rigorously model a realistic system consisting of both a probe and a sample. Influence of the probe tip parameters on image formation in scanning near-field microscopy has been investigated. Coupling of the near-field to a single-mode probe and formation of a guided fundamental mode in a probe were investigated for various probe widths and lengths. The influence of the probe taper shape and apex size on near-field images was studied for sin…
Reflection scanning microscopy.
1992
To image nontransparent samples we have utilized a special type of scanning-probe microscope that is referred to here as a reflection scanning microscope. The reflection scanning microscope provides a method for producing a scanned point light source as well as a system for collecting the light that is reflected by the sample. The system, which uses an optical fiber coupler, is easily installed on an existing photon scanning tunneling microscope. A calculation of the coupling coefficient between the natural propagation mode of the optical fiber and the light that is reflected by the sample is presented along with a comparison between calculated and measured values of the intensity of the li…
Imaging of surface plasmon propagation and edge interaction using a photon scanning tunneling microscope
1994
We report the direct imaging of surface plasmon propagation on thin silver films using the photon scanning tunneling microscope. It is found that the surface plasmon remains tightly confined in the original launch direction with insignificant scattering to other momentum states. A propagation length of 13.2 \ensuremath{\mu}m is measured at \ensuremath{\lambda}=632.8 nm. We also present images showing the interaction of a surface plasmon with the edge of the metal film supporting it. The most remarkable feature is the absence of specularly reflected beam.
Magnetic Domain Imaging with a Photoemission Microscope
1997
ABSTRACTPhotoelectron emission microscopy (PEEM) has proven to be a versatile analytical technique in surface science. When operated with circularly polarized light in the soft x-ray regime, however, photoemission microscopy offers a unique combination of magnetic and chemical information. Exploiting the high brilliance and circular polarization available at a helical undulator beamline, the lateral resolution in the imaging of magnetic domain structures may be pushed well into the sub-micrometer range. Using a newly designed photoemission microscope we show that under these circumstances not only domains, but also domain walls can be selectively investigated. The high sensitivity of the te…
A computer controlled patterning system for scanning probe microscopes
1999
Abstract A pattern generator system for lithography based on scanning force microscopes has been developed. Patterns to be miniaturized onto a chip can be scanned or drawn by any common graphical program. The pattern file is used to control a voltage simultaneously with the microscope probe scanning the surface of the substrate. The voltage can be used in numerous different ways to manipulate the substrate, depending on the lithographic method preferred. We have demonstrated the system by adding this voltage to the z -piezo voltage of the scanner, in order to make the probe plow the pattern into a film spinned on the sample. To maintain linearity in zooming in and rotating the scanning dire…
Resolution of the photon scanning tunneling microscope: influence of physical parameters
1992
Abstract The photon scanning tunneling microscope (PSTM) is the photon analogue of the electron scanning tunneling microscope (ESTM). It uses the evanescent field due to total internal reflection (TIR) of a light beam in a prism modulated by a sample placed on the base of the prism. Our experimental results shown details which present a lateral size as small as 200 A. The PSTM axial resolution is more difficult to evaluate. It is a function of the roughness of the sample. For very smooth samples, images shown an axial resolution of about 10 A. At last we discuss how both lateral and axial resolution can be affected by several parameters such as the tip surface distance and the roughness of …
Local detection of the optical magnetic field in the near zone of dielectric samples
2000
International audience; We present a study of the influence of the probe composition on the formation of constant-height photon scanning tunneling microscope images when observing a dielectric sample. Dramatic effects due to the metallization of the tip are presented and discussed in detail. We show how the recorded images can look quite different when the probe is dielectric or coated with gold. Comparison with numerical calculations indicate that the experimental signals are of electric or magnetic nature depending on the composition of the tip. For well-defined conditions, gold-coated tips provide images of the distribution of the magnetic field intensity associated with the optical near…
Application of Tuning Fork Sensors for In-situ Studies of Dynamic Force Interactions Inside Scanning and Transmission Electron Microscopes
2012
Mechanical properties of nanoscale contacts have been probed in-situ by specially developed force sensor based on a quartz tuning fork resonator (TF). Additional control is provided by observation of process in scanning electron microscope (SEM) and transmission electron microscope (TEM). A piezoelectric manipulator allows precise positioning of atomic force microscope (AFM) probe in contact with another electrode and recording of the TF oscillation amplitude and phase while simultaneously visualizing the contact area in electron microscope. Electrostatic control of interaction between the electrodes is demonstrated during observation of the experiment in SEM. In the TEM system the TF senso…